SCR Elektroniks Pvt Ltd
MCB Instantaneous Trip Test Bench
(IEC: 60898-1:2002 Clause 9.10.2)
The SCR Elektroniks MCB Instantaneous Trip Test Bench is designed for Testing of MCB to carry out “Test of Instantaneous Tripping and of correct opening of the Contacts” as per IEC: 60898-1:2002 Clause 9.10.2 at rated voltage. This test is carried out with power factor between 0.95 and 1 with the sequence operation being O-t-CO-t-CO-t-CO with timings as specified in 9.12.11.1.
This test equipment also covers testing as per Indian Standard IS 8828 as well as Indonesian Standard SNI 8528-1 (BSN)
- Completely stand alone test bench after initial configuration of parameters
- Output terminals for displaying current on an oscilloscope
- Sequence : By sequencing unit to get O-t-CO-t-CO-t-CO automatic
- Necessary lamps for quick indication on the front panel
- Microcontroller based timer to program test sequences
- Easy Serviceability due to smart internal wiring pattern
- Current Measurement : Transient Recording Meter to hold the current
- Fixture: Electro-pneumatic Fixture with Protected compartment
- Hold function on transient recording meter ensures holding the transient current value
- Input : 415V, 2 phase with neutral
- Time Measured : 0.1msec to 200msec
- Rating of MCBs : 0.5A to 63A
- Curve : B, C & D Short time
- Test Current : 1.5A to 1500A
- Load : Distributed Resistive Load Bank 0.01Ω to 100Ω
- CT Ranges : 2.5A, 5A, 10A, 25A, 50A, 100A, 250A, 500A, 750A, 1500A (Selected through shorting link)
- Selection of Load: By shorting link as per chart
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Supply Required :
a) Phase I Short Time 240V@700A
b) Phase II 240V@ 5A
The product can be customized as per the MCB range (upto 63 A or 125 A) and as per the MCB curve. The PC based variant is not very popular, but the users can opt for the same if the voltage and current waveforms are desired to be plotted on a PC.
The product is intended to test the instantaneous trip capacity at rated voltage. This test follows a peculiar contact open and contact close pattern and is different in application than the magnetic test that is done at a conveniently low voltage.